Search results for "Structured illumination"

showing 10 items of 10 documents

Improvement of two-dimensional structured illumination microscopy with an incoherent illumination pattern of tunable frequency.

2018

In two-dimensional structured illumination microscopy (2D-SIM), high-resolution images with optimal optical sectioning (OS) cannot be obtained simultaneously. This tradeoff can be overcome by using a tunable-frequency 2D-SIM system and a proper reconstruction method. The goal of this work is twofold. First, we present a computational approach to reconstruct optical-sectioned images with super-resolution enhancement (OS-SR) by using a tunable SIM system. Second, we propose an incoherent tunable-frequency 2D-SIM system based on a Fresnel biprism implementation. Integration of the proposed computational method with this tunable structured illumination (SI) system results in a new 2D-SIM system…

Optical sectioningComputer scienceImage qualitymedia_common.quotation_subjectMultispectral imageStructured illumination microscopy02 engineering and technologyLateral resolution01 natural scienceslaw.invention010309 opticsComputational photographyOpticslaw0103 physical sciencesContrast (vision)Electrical and Electronic EngineeringEngineering (miscellaneous)media_commonbusiness.industry021001 nanoscience & nanotechnologySuperresolutionAtomic and Molecular Physics and OpticsLens (optics)Noise (video)0210 nano-technologybusinessApplied optics
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Structured-light imaging through scattering

2016

We present a structured illumination technique to image objects hidden beneath scattering. The sample is computationally retrieved from a known ensemble of light patterns codified onto a digital micromirror device and photocurrent fluctuations provided by a detector with no spatial resolution. Results of laboratory experiments will be shown. Article not available.

PhotocurrentPhysicsScatteringbusiness.industryDetectorPhysics::OpticsStructured illuminationSample (graphics)Digital micromirror devicelaw.inventionOpticslawbusinessImage resolutionStructured lightImaging and Applied Optics 2016
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Automatic fringe pattern enhancement using truly adaptive period-guided bidimensional empirical mode decomposition.

2020

Fringe patterns encode the information about the result of a measurement performed via widely used optical full-field testing methods, e.g., interferometry, digital holographic microscopy, moiré techniques, structured illumination etc. Affected by the optical setup, changing environment and the sample itself fringe patterns are often corrupted with substantial noise, strong and uneven background illumination and exhibit low contrast. Fringe pattern enhancement, i.e., noise minimization and background term removal, at the pre-processing stage prior to the phase map calculation (for the measurement result decoding) is therefore essential to minimize the jeopardizing effect the mentioned error…

Computer sciencePhase contrast microscopyStructured illumination microscopy02 engineering and technology01 natural sciencesHilbert–Huang transformlaw.invention010309 opticsOpticslaw0103 physical sciencesbusiness.industrySignal reconstructionVDP::Technology: 500Moiré patternFilter (signal processing)021001 nanoscience & nanotechnologyAtomic and Molecular Physics and OpticsInterferometryVDP::Teknologi: 500Digital holographic microscopySpatial frequencySpeckle imaging0210 nano-technologybusinessAlgorithmOptics express
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Investigating the performance of reconstruction methods used in structured illumination microscopy as a function of the illumination pattern's modula…

2016

Surpassing the resolution of optical microscopy defined by the Abbe diffraction limit, while simultaneously achieving optical sectioning, is a challenging problem particularly for live cell imaging of thick samples. Among a few developing techniques, structured illumination microscopy (SIM) addresses this challenge by imposing higher frequency information into the observable frequency band confined by the optical transfer function (OTF) of a conventional microscope either doubling the spatial resolution or filling the missing cone based on the spatial frequency of the pattern when the patterned illumination is two-dimensional. Standard reconstruction methods for SIM decompose the low and hi…

DiffractionMicroscopeOptical sectioningFrequency bandComputer scienceStructured illumination microscopy01 natural scienceslaw.invention010309 opticsOpticsOptical microscopelawLive cell imagingOptical transfer function0103 physical sciencesMicroscopyFluorescence microscopeComputer vision010306 general physicsImage resolutionbusiness.industrySuperresolutionSpatial frequencyArtificial intelligencebusinessLuminescenceFrequency modulationSPIE Proceedings
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Optimal design of incoherent tunable-frequency structured illumination microscope scheme

2018

Structured illumination microscopy (SIM) improves resolution and optical sectioning capability compared to conventional widefield techniques. The main idea of this method is the illumination of the sample with a structured pattern of fixed spatial modulation frequency. Previously, a Fresnel biprism has been implemented in a structured illumination (SI) device providing tunable-frequency sinusoidal patterns. However, the use of this SI system introduces a tradeoff between the visibility and field of view of the illumination fringes. In this contribution, we analyze theoretically this tradeoff and propose the optimal design for the Fresnel biprism-based SIM system.

Optimal designScheme (programming language)MicroscopeOptical sectioningbusiness.industryComputer scienceResolution (electron density)Visibility (geometry)ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONStructured illumination microscopyField of viewSample (graphics)law.inventionOpticslawbusinesscomputercomputer.programming_language2018 IEEE 15th International Symposium on Biomedical Imaging (ISBI 2018)
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Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy.

2019

A method of determining unknown phase-shifts between elementary images in two-dimensional Structured Illumination Microscopy (2D-SIM) is presented. The proposed method is based on the comparison of the peak intensity of spectral components. These components correspond to the inherent structured illumination spectral content and the residual compo- nent that appears from wrongly estimated phase-shifts. The estimation of the phase-shifts is carried out by finding the absolute maximum of a function defined as the normalized peak intensity difference in the Fourier domain. This task is performed by an optimization method providing a fast estimation of the phase-shift. The algorithm stability an…

DiffractionStatistical NoisePhotonStructured illumination microscopy02 engineering and technologySignal-To-Noise RatioResidual01 natural sciencesPhase DeterminationMathematical and Statistical TechniquesFluorescence MicroscopyImage Processing Computer-AssistedFourier Anàlisi deMathematicsMicroscopyMultidisciplinaryFourier AnalysisPhysicsApplied MathematicsSimulation and ModelingStatisticsQRLight Microscopy021001 nanoscience & nanotechnologyGaussian NoiseMicroscòpiaFourier analysisPhysical SciencessymbolsCrystallographic TechniquesMedicine0210 nano-technologyAlgorithmDiffractionElementary ParticlesAlgorithmsResearch ArticleImaging TechniquesComputationScienceResearch and Analysis Methods010309 opticssymbols.namesakeRobustness (computer science)0103 physical sciencesParticle PhysicsPhotonsMicroscopy FluorescenceGaussian noiseWavesMathematicsImatges Processament Tècniques digitalsPLoS ONE
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Tunable structured illumination system based on a Wollaston prism

2018

Experimental verification of a simple illumination system to generate a 1D structured pattern with tunable modulation frequency is shown based on a Wollaston prism illuminated by the diffracted field of an incoherent linear source.

PhysicsDiffractionbusiness.industryStructured illumination microscopyPhysics::OpticsWollaston prismStructured illuminationlaw.inventionLED lampOpticslawSpatial frequencybusinessFrequency modulationImaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP)
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Tunable-frequency three-dimensional structured illumination microscopy with reduced data-acquisition

2018

The performance of a tunable three-dimensional (3D) structured illumination microscope (SIM) system and its ability to provide simultaneously super-resolution (SR) and optical-sectioning (OS) capabilities are investigated. Numerical results show that the performance of our 3D-SIM system is comparable with the one provided by a three-wave interference SIM, while requiring 40% fewer images for the reconstruction and providing frequency tunability in a cost-effective implementation. The performance of the system has been validated experimentally with images from test samples, which were also imaged with a commercial SIM based on incoherent-grid projection for comparison. Restored images from d…

0301 basic medicineMicroscopeMaterials sciencebusiness.industryStructured illumination microscopyIterative reconstructionStructured illumination01 natural sciencesAtomic and Molecular Physics and Opticslaw.invention010309 optics03 medical and health sciences030104 developmental biologyOpticsData acquisitionInterference (communication)law0103 physical sciencesbusinessProjection (set theory)Diffraction gratingOptics Express
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Optical transfer function engineering for a tunable 3D structured illumination microscope

2019

Two important features of three-dimensional structured illumination microscopy (3D-SIM) are its optical sectioning (OS) and super-resolution (SR) capabilities. Previous works on 3D-SIM systems show that these features are coupled. We demonstrate that a 3D-SIM system using a Fresnel biprism illuminated by multiple linear incoherent sources provides a structured illumination pattern whose lateral and axial modulation frequencies can be tuned separately. Therefore, the compact support of the synthetic optical transfer function (OTF) can be engineered to achieve the highest OS and SR capabilities for a particular imaging application. Theoretical performance of our engineered system based on the…

MicroscopeMaterials scienceOptical sectioningbusiness.industryStructured illumination microscopy02 engineering and technology021001 nanoscience & nanotechnologyStructured illumination01 natural sciencesAtomic and Molecular Physics and Opticslaw.invention010309 opticsOpticslawModulationOptical transfer function0103 physical sciencesSpatial frequency0210 nano-technologybusinessRefractive indexOptics Letters
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Evaluation of the use of wavefront encoding to reduce depth-induced aberration in structured-illumination microscopy

2018

Three-dimensional imaging is affected by depth-induced spherical aberration (SA) when imaging deep into an optically thick sample. In this work, we evaluate the impact of SA on the performance of incoherent grating-projection structured illumination microscopy (SIM). In particular, we analyze the reduction of the contrast in the structured pattern and compare the reconstructed SIM images for different amounts of SA. In order to mitigate the impact of SA, we implement and evaluate in SIM a wavefront encoded imaging system using a square cubic (SQUBIC) phase mask, an approach shown previously to be successful in conventional microscopy.

WavefrontMaterials sciencebusiness.industrymedia_common.quotation_subjectStructured illumination microscopySample (graphics)Òptica Aparells i instrumentsReduction (complexity)Spherical aberrationOpticsEncoding (memory)MicroscopyContrast (vision)businessmedia_common
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